For Immediate Release
Radiation Assured Devices™ (RAD) CTO Joseph M. Benedetto Ph.D. to host Short Course on Single Event Functional Interrupts (SEFIs) in COTS SDRAMs at 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) on 14 July 2008 in Tucson, Arizona
Colorado Springs, CO - 27 June 2008 - Radiation Assured Devices™ (RAD) CTO Joseph M. Benedetto Ph.D. will be hosting the Short Course on Single Event Functional Interrupts (SEFIs) in Commercial Off The Shelf (COTS) SDRAMs at the 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) on 14 July 2008 in Tucson, Arizona. This conference is scheduled for 14-18 July. Dr. Benedetto has been heavily involved in the radiation effects community for more than 25 years. He has published more than 75 technical articles in a wide variety of publications including IEEE Transactions on Nuclear Science, Journal of Applied Physics and IEEE Spectrum. Dr. Benedetto has been also awarded multiple patents in the area of hardening spacecraft electronics.
"We are proud that Joe is one of the leaders in the radiation effects community and we are extremely pleased to benefit from his tremendous expertise in this area on a daily basis." said Chris Barton, CEO of Radiation Assured Devices. "Joe's knowledge is both broad as well as deep and it is a pleasure to watch Joe easily solve some of the most difficult technical problems that we encounter."
The 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) is set for July 14-18, 2008, at the JW Marriott Starr Pass Resort in Tucson, Arizona.
The NSREC Brochure and Registration forms are posted on the website at http://www.nsrec.com. Electronic registration is now open and available to attendees. Registration can be faxed, mailed or completed through the website.
About Radiation Assured Devices™
Radiation Assured Devices, Inc. (RAD) uses commercial and specialty technologies to provide state of the art radiation engineering and qualification services as well as radiation hardened products for commercial and military spaceborne electronics with the highest levels of reliability and radiation assurance. RAD has extensive experience in production radiation effects testing in the approximately 20,000 square foot Longmire Laboratory located in Colorado Springs, CO. RAD offers a comprehensive radiation effects test and support laboratory. RAD is ISO 9001:2000 certified.
RAD's current radiation capabilities include: Two Co-60 sources, Cs-137 source, 14MeV Neutron Generator, 1E11 rad/s Flash X-Ray/Prompt Dose Capabilities; Total Dose (TID) Testing; Enhanced Low Dose Radiation Sensitivity (ELDRS) Testing; Heavy Ion Single Event Effects (SEE) Testing including Single Event Latch-up (SEL), Singe Event Upset (SEU), Single Event Transient (SET) and Single Event Functional Interrupt (SEFI); Radiation Lot Acceptance Testing (RLAT); Focal Plane Array (FPA) Irradiation, Characterization and Testing; Radiation Engineering and Component Qualification Planning; Wafer Lot Radiation Screening, Characterization, and Qualification; Mil-Std Screening and Qualification of Advanced COTS Devices as well as Design Engineering for Radiation Hardened ICs and electronic systems.
RAD also offers the following support services: Quick-Turn, low-cost Prototype IC Assembly; Backside Chip Thinning and Re-assembly for Heavy Ion Radiation testing; Chip Removal and Re-assembly for Heavy Ion Radiation testing; PC Board Design, Laser marking and Laser cutting.
It is the vision and mission of RAD to be the company of choice for radiation device testing and engineering services.
Founded in 2003, Radiation Assured Devices is privately held and based in Colorado Springs, CO. For more information visit: http://www.RadiationAssuredDevices.com.
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PR Contact:
Charlie Beebout
Radiation Assured Devices
phone: 719.531.0800 x113
e-mail: CBeebout@RadiationAssuredDevices.com
©2008 Radiation Assured Devices. All rights reserved. Trademarks and brands are the property of their respective owners.
Radiation Assured Devices™ (RAD) CTO Joseph M. Benedetto Ph.D. to host Short Course on Single Event Functional Interrupts (SEFIs) in COTS SDRAMs at 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) on 14 July 2008 in Tucson, Arizona
Colorado Springs, CO - 27 June 2008 - Radiation Assured Devices™ (RAD) CTO Joseph M. Benedetto Ph.D. will be hosting the Short Course on Single Event Functional Interrupts (SEFIs) in Commercial Off The Shelf (COTS) SDRAMs at the 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) on 14 July 2008 in Tucson, Arizona. This conference is scheduled for 14-18 July. Dr. Benedetto has been heavily involved in the radiation effects community for more than 25 years. He has published more than 75 technical articles in a wide variety of publications including IEEE Transactions on Nuclear Science, Journal of Applied Physics and IEEE Spectrum. Dr. Benedetto has been also awarded multiple patents in the area of hardening spacecraft electronics.
"We are proud that Joe is one of the leaders in the radiation effects community and we are extremely pleased to benefit from his tremendous expertise in this area on a daily basis." said Chris Barton, CEO of Radiation Assured Devices. "Joe's knowledge is both broad as well as deep and it is a pleasure to watch Joe easily solve some of the most difficult technical problems that we encounter."
The 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC) is set for July 14-18, 2008, at the JW Marriott Starr Pass Resort in Tucson, Arizona.
The NSREC Brochure and Registration forms are posted on the website at http://www.nsrec.com. Electronic registration is now open and available to attendees. Registration can be faxed, mailed or completed through the website.
About Radiation Assured Devices™
Radiation Assured Devices, Inc. (RAD) uses commercial and specialty technologies to provide state of the art radiation engineering and qualification services as well as radiation hardened products for commercial and military spaceborne electronics with the highest levels of reliability and radiation assurance. RAD has extensive experience in production radiation effects testing in the approximately 20,000 square foot Longmire Laboratory located in Colorado Springs, CO. RAD offers a comprehensive radiation effects test and support laboratory. RAD is ISO 9001:2000 certified.
RAD's current radiation capabilities include: Two Co-60 sources, Cs-137 source, 14MeV Neutron Generator, 1E11 rad/s Flash X-Ray/Prompt Dose Capabilities; Total Dose (TID) Testing; Enhanced Low Dose Radiation Sensitivity (ELDRS) Testing; Heavy Ion Single Event Effects (SEE) Testing including Single Event Latch-up (SEL), Singe Event Upset (SEU), Single Event Transient (SET) and Single Event Functional Interrupt (SEFI); Radiation Lot Acceptance Testing (RLAT); Focal Plane Array (FPA) Irradiation, Characterization and Testing; Radiation Engineering and Component Qualification Planning; Wafer Lot Radiation Screening, Characterization, and Qualification; Mil-Std Screening and Qualification of Advanced COTS Devices as well as Design Engineering for Radiation Hardened ICs and electronic systems.
RAD also offers the following support services: Quick-Turn, low-cost Prototype IC Assembly; Backside Chip Thinning and Re-assembly for Heavy Ion Radiation testing; Chip Removal and Re-assembly for Heavy Ion Radiation testing; PC Board Design, Laser marking and Laser cutting.
It is the vision and mission of RAD to be the company of choice for radiation device testing and engineering services.
Founded in 2003, Radiation Assured Devices is privately held and based in Colorado Springs, CO. For more information visit: http://www.RadiationAssuredDevices.com.
###
PR Contact:
Charlie Beebout
Radiation Assured Devices
phone: 719.531.0800 x113
e-mail: CBeebout@RadiationAssuredDevices.com
©2008 Radiation Assured Devices. All rights reserved. Trademarks and brands are the property of their respective owners.